León, Roberto, Werner Nagel, Joachim Ohser, and Steve Arscott. “Modeling Crack Patterns by Modified STIT Tessellations”. Image Analysis and Stereology 39, no. 1 (April 13, 2020): 33–46. Accessed April 30, 2025. http://233.ablak.arnes.si/ojs/index.php/IAS/article/view/2245.