Girard, Eric, Jean-Marc Chaix, François Valdivieso, Patrice Goeuriot, and Jacques Lechelle. “LOCAL STUDY OF DEFECTS DURING SINTERING OF UO2: IMAGE PROCESSING AND QUANTITATIVE ANALYSIS TOOLS”. Image Analysis and Stereology 27, no. 2 (May 3, 2011): 79–85. Accessed April 30, 2025. http://233.ablak.arnes.si/ojs/index.php/IAS/article/view/833.